Predicting Software and Hardware Reliability of Embedded Systems
DOI:
https://doi.org/10.37591/rrjoesa.v9i2.833Keywords:
Embedded system, probability, parameters, real time system, reliabilityAbstract
In daily existence, unwavering quality of programming frameworks is pretty much as significant as the use of programming frameworks since, in such a case that the product won't be dependable, it will get come up short whenever, abandoning catastrophes. Aside from this, assuming the product framework is an Embedded System, the unwavering quality of that inserted programming framework will be significant just as essential in light of the fact that the utilization of embedded structure is immense going from life supporting structures to flight control system, and if the unwavering quality of these frameworks has not been considered as expected it can prompt danger of lives. Subsequently, in this paper, we will examine about different part based reliabilities of inserted frameworks, their designs and their utilization as indicated by the class of the product.
References
Najeeb Ullah, et al. A Comparative Analysis of Software Reliability Growth Models using Defect Data of Closed and Open Source Software, IEEE 35th Software Engineering Workshop, 2012, 187–92p.
Khoshgoftaar TM. On Model Selection in software Reliability, 8th symposium on computational statistics, 13–14p.
Zhongzheng You, The Reliability Analysis of Embedded System, 2013 International conference on information science and cloud computing companion, 458–62p.
Li Jin Qi, Xu Jian Ping, Design and Test Method for the Reliability of Embedded System Software, 2013; 22: 74–78p.
Guo Zhen Ji, HuangFei, A Reliability Assessment Method of Embedded Systems, 2012; 2: 153–58p.
Philip Koopman, Reliability, Safety and Security in Everyday Embedded System, Carnegie Mellon University.
Vijaykrishnan Narayanan, Yuan Xie, Reliability Concerns in Embedded System Design, IEEE Explore, 2009, 118–120p.
Sapna Juneja, et al. Reliability modeling for embedded system environment compared to available reliability growth models, IEEE Xplore, 2019, 379–382p.
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